Mrozek, Ireneusz: Multi-run Memory Tests for Pattern Sensitive Faults. Cham, Springer, 2019. X, 135 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped.

• Category: Technik
• Keywords: Elektrotechnik
• Language: English (en)
• ISBN: 9783319912035
• Order Number: 4341CB

Our Price: EUR 16,--