Schubert, M.: Infrared Ellipsometry on Semiconductor Layer Structures. Phonons, Plasmons, and Polaritons. Berlin, Springer, 2004. 77 figs., XI, 193 p. Hardcover Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer Tracts in Modern Physics, Vol. 209.

• Category: Physik
• Language: English (en)
• ISBN: 978-3-540-23249-0
• Order Number: 3908AB

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