Sengupta, VLSI Design and Test.
Sengupta, VLSI Design and Test.
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Sengupta, Anirban; et al. (Eds.): VLSI Design and Test. 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019. Revised Selected Papers. Singapore, Springer, 2019. XVI, 775 p. Softcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Communications in Computer Information Science, 1066.
Unser Preis: EUR 18,-- |