Wang, Laung-Terng/Wu, Cheng-Wen/Wen, Xiaoqing: VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)). 1st ed. Morgan Kaufmann, 2006. 21 x 24 cm. 808 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped.

• Category: Varia
• Keywords: HELF
• Language: English (en)
• ISBN: 9780123705976
• Order Number: 6394VB

Our Price: EUR 16,--