Hutchings, Michael T.; Krawitz, Aaron D. (Ed.): Measurement of Residual and Applied Stress Using Neutron Diffraction. Vol. 216. Dordrecht/Boston, Springer Science/Kluwer Academic, 1992. xviii, 588 p. Softcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. NATO ASI Series, Series E: Applied Sciences, Vol. 216.

• Kategorie: Psychologie Psychiatrie Neurologie
• Sprache: Englisch (en)
• ISBN: 9789401052429
• Bestellnummer: 7950BB

Unser Preis: EUR 15,--