Shen, Statistical Performance Analysis and Modeling Techniques for Nanometer VLS…
Shen, Statistical Performance Analysis and Modeling Techniques for Nanometer VLS
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Shen, Ruijing; Tan, Sheldon X.-D.; Yu, Hao: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs. New York, Springer New York, 2012. XXIX, 305 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped.
Our Price: EUR 14,-- |
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