Li, F.M.; A. Nathan CCD Image Sensors in Deep-Ultraviolet. Degradation Behavior and Damage Mechanisms. Berlin, Springer, 2005. 84 figs., XI, 231 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Microtechnology and Mems.

• Category: Technik
• Keywords: Elektrotechnik
• Language: English (en)
• ISBN: 9783540226802
• Order Number: 1180HB

Our Price: EUR 20,--