Gutierrez, Precision Landmark Location for Machine Vision and Photogrammetry.
Gutierrez, Precision Landmark Location for Machine Vision and Photogrammetry.
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Gutierrez, José A./Armstrong, Brian S.R.: Precision Landmark Location for Machine Vision and Photogrammetry. Finding and Achieving the Maximum Possible Accuracy. 2008. London, Springer London, 2007. 16 x 24 cm. XI, 162 S. XI, 162 p. With online files/update. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Unser Preis: EUR 16,-- |