Kaupp, Gerd: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching. Application to Rough and Natural Surfaces. Berlin, Springer, 2006. 239 Fig., 7 Tabl., XII, 292 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. NanoScience and Technology.

• Kategorie: Physik
• Sprache: Englisch (en)
• ISBN: 9783540284055
• Bestellnummer: 2190JB

Unser Preis: EUR 18,--