Huisman, Data Mining and Diagnosing IC Fails.
Huisman, Data Mining and Diagnosing IC Fails.
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Huisman, Leendert M.: Data Mining and Diagnosing IC Fails. 2005. New York/ NY, Springer US, 2005. 16 x 24 cm. XX, 250 S. XX, 250 p. 46 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. (Frontiers in Electronic Testing).
Unser Preis: EUR 16,-- |