Lange & Springer Antiquariat Dorotheenstraße 16, 10117 Berlin

Bhushan, Applied Scanning Probe Methods V.

Bhushan, Applied Scanning Probe Methods V.

Bhushan, Bharat et al. (Eds.): Applied Scanning Probe Methods V. Scanning Probe Microscopy Techniques. Berlin, Springer, 2007. 194 fig., 12 tabs., XLV, 344 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. NanoScience and Technology.

  • Category: Physik
  • Language: English (en)
  • ISBN: 9783540373155
  • Order Number: 1954GB

Our Price: EUR 22,--