Foster, Scanning Probe Microscopy.
Foster, Scanning Probe Microscopy.
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Foster, Adam S.; Werner A. Hofer: Scanning Probe Microscopy. Atomic Scale Engineering by Forces and Currents. New York, Springer, 2006. 116 figs., XIV, 281 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. NanoScience and Technology
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