Posser, Electromigration Inside Logic Cells.
Posser, Electromigration Inside Logic Cells.
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Posser, G. et al (Eds.): Electromigration Inside Logic Cells. Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Cham, Springer, 2017. xx, 118 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped.
Unser Preis: EUR 14,-- |